High-resolution detection of microwave fields on chip surfaces based on scanning microwave microscopy

T Pei, F Cheng, XD Jia, ZH Li, H Guo… - IEEE Transactions …, 2023 - ieeexplore.ieee.org
With the development of microwave chips toward high integration, new challenges have
been posed to high-precision microwave field test techniques. In this article, we propose a …

[HTML][HTML] Fabrication of Ultra-Sharp Tips by Dynamic Chemical Etching Process for Scanning Near-Field Microwave Microscopy

CH Joseph, G Capoccia, A Lucibello, E Proietti… - Sensors, 2023 - mdpi.com
This work details an effective dynamic chemical etching technique to fabricate ultra-sharp
tips for Scanning Near-Field Microwave Microscopy (SNMM). The protruded cylindrical part …

Scanning Microwave Microscopy Subsurface Detection of Magneto-Impedance Effect in Thin Film Permalloy

G Fabi, M Sparey, M Leitner, A Silvestri… - 2024 IEEE/MTT-S …, 2024 - ieeexplore.ieee.org
Permalloy-based thin films are ferromagnetic materials with excellent magnetic properties,
and their detection is appealing for several applications. Here, a Scanning Microwave …