The existence of leakage current pathways leading to the appearance of impact ionization and the potential device breakdown in planar Gunn GaN diodes is analyzed by means of a …
This article presents a hybrid artificial intelligence (AI)-thermal model for the determination of the current and lattice temperature of a device under a given bias voltage. The model is …
An investigation into self-switching diodes based on highly doped GaN is conducted under direct current (dc) bias conditions. Different device geometries are explored under various …
Impact ionization originated by the buffer leakage current, together with high electric fields (> 3 MV/cm) at the anode corner of the isolating trenches, has been identified as the failure …
IS Panyaev, DG Sannikov… - Computer …, 2024 - computeroptics.ru
One-dimensional three-periodic photonic-crystal (PC) structures based on dielectric nonmagnetic materials (SiO 2, Al 2 O 3, TiO 2, ZrO 2) that form [(ab) N (cd) M] K supercells …
Рассмотрены одномерные трёхпериодические фотонно-кристаллические структуры на основе диэлектрических немагнитных материалов (SiO2, Al2O3, TiO2, ZrO2) …
L Huo, R Lingaparthi, K Shabdurasulov… - 2023 18th European …, 2023 - ieeexplore.ieee.org
In this study, the performance of a doped-GaN-based planar Gunn diode (PGD) with a T- shape channel is investigated through numerical simulations. The effects of the vertical …
Gunn oscillations are expected to appear in GaN at high electric fields due to its negative differential mobility, but they have never been observed experimentally due to the large …
In this contribution we present a study of GaN Planar Gunn Diodes (PGDs) through a combined deep learning-Monte Carlo (MC) approach. MC simulations will be used to …