M Kobayashi - Applied Physics Express, 2018 - iopscience.iop.org
In today's highly information-oriented society, a continuously increasing number of computing devices are needed in the Internet-of-Things (IoT) era, from high-end servers in …
J Zhou, G Han, Q Li, Y Peng, X Lu… - 2016 IEEE …, 2016 - ieeexplore.ieee.org
We report the first ferroelectric (FE) HfZrO x (HZO) Ge and GeSn pMOSFETs with sub-60 mV/decade subthreshold swing (SS)(40~ 43 mV/decade), negligible hysteresis, and …
In this paper, we show a validation of our compact model for negative capacitance FET (NCFET) presented in Part I. The model is thoroughly validated with the TCAD simulations …
We present a physics-based compact model for a ferroelectric negative capacitance FET (NCFET) with a metal-ferroelectric-insulator-semiconductor (MFIS) structure. The model is …
Data intensive applications such as AI (Artificial Intelligence) and IoT (Internet of Things) demand high performance and highly reliable non-volatile memories (NVM). FeFET offers …
Y Li, Y Kang, X Gong - IEEE Transactions on Electron Devices, 2017 - ieeexplore.ieee.org
Negative capacitance ferroelectric (FE) field-effect transistor (FeFET) is promising to address the issue of the increasing power density in digital circuit by realizing sub-60 mV/decade …
The ferroelectric field‐effect transistor (FeFET) is one of the leading contenders to succeed charge‐trap‐based flash memory (CTF) devices in the current vertically‐integrated NAND …
J Zhou, G Han, Y Peng, Y Liu, J Zhang… - IEEE Electron …, 2017 - ieeexplore.ieee.org
Negative capacitance (NC) GeSn pFETs integrated with HfZrO x (HZO) ferroelectric film is demonstrated with sub-20 mV/decade subthreshold swing (SS) over two orders of …
A Jain, MA Alam - IEEE Transactions on Electron Devices, 2014 - ieeexplore.ieee.org
The current-voltage characteristics of a classical field-effect transistor (FET) is dictated by thermal injection of charge carriers over a gate-controlled energy barrier. It is well known …