In-line detection of apple defects using three color cameras system

Z Xiao-bo, Z Jie-wen, L Yanxiao, M Holmes - Computers and Electronics in …, 2010 - Elsevier
Identification of apple stem-ends and calyxes from defects on process grading lines is a
challenging task due to the complexity of the process. An in-line detection of the apple defect …

In-line detection of apple defects using three color cameras system

Z Xiao-bo, Z Jie-wen, L Yanxiao… - Computers and Electronics …, 2010 - dl.acm.org
Identification of apple stem-ends and calyxes from defects on process grading lines is a
challenging task due to the complexity of the process. An in-line detection of the apple defect …

In-line detection of apple defects using three color cameras system

Z Xiao-bo, Z Jie-wen, L Yanxiao… - … and Electronics in …, 2010 - ui.adsabs.harvard.edu
Identification of apple stem-ends and calyxes from defects on process grading lines is a
challenging task due to the complexity of the process. An in-line detection of the apple defect …

In-line detection of apple defects using three color cameras system.

ZXB Zou XiaoBo, ZJW Zhao JieWen, LYX Li YanXiao… - 2010 - cabidigitallibrary.org
Identification of apple stem-ends and calyxes from defects on process grading lines is a
challenging task due to the complexity of the process. An in-line detection of the apple defect …

[引用][C] In-line detection of apple defects using three color cameras system

XB ZOU, JW ZHAO, LI YANXIAO… - … and electronics in …, 2010 - pascal-francis.inist.fr
In-line detection of apple defects using three color cameras system CNRS Inist Pascal-Francis
CNRS Pascal and Francis Bibliographic Databases Simple search Advanced search Search by …

In-line detection of apple defects using three color cameras system

Z Xiao-bo, Z Jie-wen, L Yanxiao, M Holmes - Computers and Electronics in …, 2010 - infona.pl
Identification of apple stem-ends and calyxes from defects on process grading lines is a
challenging task due to the complexity of the process. An in-line detection of the apple defect …

[引用][C] In-line detection of apple defects using three color cameras system

XB ZOU, JW ZHAO, LI YANXIAO, M HOLMES - Computers and electronics …, 2010 - Elsevier

[引用][C] In-line detection of apple defects using three color cameras system

Z Xiao-bo, Z Jie-wen, L Yanxiao, M Holmes - 2010