X-ray Absorption Spectroscopy Study of TiO2–x Thin Films for Memory Applications

D Carta, G Mountjoy, A Regoutz, A Khiat… - The Journal of …, 2015 - ACS Publications
Metal–insulator–metal (MIM) devices based on titanium dioxide thin films exhibit resistive
switching behavior (RS); ie, they have the ability to switch the electrical resistance between …

Conductive atomic force microscopy investigation of switching thresholds in titanium dioxide thin films

M Trapatseli, D Carta, A Regoutz, A Khiat… - The Journal of …, 2015 - ACS Publications
Titanium dioxide thin films have attracted increasing attention due to their potential in next-
generation memory devices. Of particular interest are applications in resistive random …

Role and Optimization of the Active Oxide Layer in TiO2‐Based RRAM

A Regoutz, I Gupta, A Serb, A Khiat… - Advanced Functional …, 2016 - Wiley Online Library
TiO2 is commonly used as the active switching layer in resistive random access memory.
The electrical characteristics of these devices are directly related to the fundamental …

Self-organized titanium oxide nano-channels for resistive memory application

A Barman, CP Saini, P Sarkar, B Satpati… - Journal of Applied …, 2015 - pubs.aip.org
Towards developing next generation scalable TiO 2-based resistive switching (RS) memory
devices, the efficacy of 50 keV Ar+-ion irradiation to achieve self-organized nano-channel …

Interface‐Engineered Amorphous TiO2‐Based Resistive Memory Devices

HY Jeong, JY Lee, SY Choi - Advanced Functional Materials, 2010 - Wiley Online Library
Crossbar‐type bipolar resistive memory devices based on low‐temperature amorphous
TiO2 (a‐TiO2) thin films are very promising devices for flexible nonvolatile memory …

In situ control of oxygen vacancies in TiO2 by atomic layer deposition for resistive switching devices

SJ Park, JP Lee, JS Jang, H Rhu, H Yu, BY You… - …, 2013 - iopscience.iop.org
Oxygen vacancies (VO) have profound effects on the physical and chemical performance of
devices based on oxide materials. This is particularly true in the case of oxide-based …

Oxygen Vacancies Control Transition of Resistive Switching Mode in Single-Crystal TiO2 Memory Device

J Ge, M Chaker - ACS applied materials & interfaces, 2017 - ACS Publications
Epitaxial TiO2 thin films were grown by radio-frequency magnetron sputtering on conductive
Nb-SrTiO3 substrates. X-ray photoelectron spectroscopy reveals that the oxygen vacancies …

Improvement of resistive switching uniformity in TiOx films by nitrogen annealing

YT Li, Y Wang, S Liu, SB Long, HB Lv, Q Liu, Q Wang… - 2011 - ir.lzu.edu.cn
摘要 The uniformity of resistive switching parameters is important to resistive random access
memory (RRAM) device, development. This work reports a remarkably improved uniformity …

Influence of Ti top electrode thickness on the resistive switching properties of forming free and self-rectified TiO2− x thin films

P Bousoulas, I Michelakaki, D Tsoukalas - Thin Solid Films, 2014 - Elsevier
The memory performance of titanium oxide (TiO 2− x)-based resistive memories containing
an ultra thin reactive Ti top electrode can be greatly enhanced. Very good switching memory …

Influence of oxygen content of room temperature TiO2− x deposited films for enhanced resistive switching memory performance

P Bousoulas, I Michelakaki, D Tsoukalas - Journal of Applied Physics, 2014 - pubs.aip.org
In this work, we demonstrate that TiO 2− x based Resistive Random Access Memory devices
can function without an initial electroforming process and a wide range of switching ratios …